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{"_buckets": {"deposit": "4f969a7b-1621-41fb-b483-b6467662255b"}, "_deposit": {"created_by": 1, "id": "11568", "owners": [1], "pid": {"revision_id": 0, "type": "depid", "value": "11568"}, "status": "published"}, "_oai": {"id": "oai:kansai-u.repo.nii.ac.jp:00011568", "sets": ["1597"]}, "author_link": ["27283", "27277", "27281", "27282", "27284", "27280", "27279", "27278"], "item_9_alternative_title_20": {"attribute_name": "その他のタイトル", "attribute_value_mlt": [{"subitem_alternative_title": "Quantitative Analysis of Oolitics by X-Ray Diffractometer"}]}, "item_9_biblio_info_7": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "1999", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "3", "bibliographicPageEnd": "182", "bibliographicPageStart": "177", "bibliographicVolumeNumber": "71", "bibliographic_titles": [{"bibliographic_title": "鋳造工学"}]}]}, "item_9_description_4": {"attribute_name": "概要", "attribute_value_mlt": [{"subitem_description": "Composition is the most important element in controlling green sand. Oolitics, one of the composition, is quantified by analyzing quartz by the silica program test. However this test takes more than 8 hours and the analyzer needs to spend one hour on this work. To shorten this time, we examined another method to quantify oolitics by using X-ray diffractometric analysis for quartz. We chose the calibration curve method as a quantitative. First, we changed the quartz content by using quartz and feldspar, then measured the diffraction X-ray intensity, and obtained calibration curve between quartz content and diffraction X-ray intensity. As a result of comparing each diffraction X-ray intensity of the first peak (angle of diffraction is 2 θ 26.6°) and the second peak (2 θ 20.9°) with quartz quantity analyzed from the silica program, the quantitative precision from the second peak was found to be better, because there was no other material peaked around 2 θ 20.9° for green sand. Although it takes almost 6 hours to analyze quartz by X-ray diffractometric analysis, the actual working time for the analyzer was shortened less than 30 minutes, and the efficiency improved more than two times compared with the silica program test.", "subitem_description_type": "Other"}]}, "item_9_description_42": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"subitem_description": "Journal Article", "subitem_description_type": "Other"}]}, "item_9_full_name_3": {"attribute_name": "著者別名", "attribute_value_mlt": [{"nameIdentifiers": [{"nameIdentifier": "27281", "nameIdentifierScheme": "WEKO"}], "names": [{"name": "Kurokawa, Yutaka"}]}, {"nameIdentifiers": [{"nameIdentifier": "27282", "nameIdentifierScheme": "WEKO"}], "names": [{"name": "Yaoi, Jun"}]}, {"nameIdentifiers": [{"nameIdentifier": "27283", "nameIdentifierScheme": "WEKO"}], "names": [{"name": "Ota, Hideaki"}]}, {"nameIdentifiers": [{"nameIdentifier": "27284", "nameIdentifierScheme": "WEKO"}], "names": [{"name": "Miyake, Hidekazu"}]}]}, "item_9_publisher_34": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "日本鋳造工学会"}]}, "item_9_rights_13": {"attribute_name": "権利", "attribute_value_mlt": [{"subitem_rights": "日本鋳造工学会(http://www.jfs.or.jp/)"}]}, "item_9_source_id_10": {"attribute_name": "書誌レコードID", "attribute_value_mlt": [{"subitem_source_identifier": "AN10514770", "subitem_source_identifier_type": "NCID"}]}, "item_9_source_id_8": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "13420429", "subitem_source_identifier_type": "ISSN"}]}, "item_9_version_type_17": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_version_resource": "http://purl.org/coar/version/c_970fb48d4fbd8a85", "subitem_version_type": "VoR"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "黒川, 豊"}], "nameIdentifiers": [{"nameIdentifier": "27277", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "矢尾井, 潤"}], "nameIdentifiers": [{"nameIdentifier": "27278", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "太田, 英明"}], "nameIdentifiers": [{"nameIdentifier": "27279", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "三宅, 秀和"}], "nameIdentifiers": [{"nameIdentifier": "27280", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2019-05-23"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "KU-1100-19991019-04.pdf", "filesize": [{"value": "714.2 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 714200.0, "url": {"label": "KU-1100-19991019-04.pdf", "url": "https://kansai-u.repo.nii.ac.jp/record/11568/files/KU-1100-19991019-04.pdf"}, "version_id": "427cf56d-9b2e-4b95-923d-d45e9f2f262f"}]}, "item_keyword": {"attribute_name": "キーワード", "attribute_value_mlt": [{"subitem_subject": "oolitics", "subitem_subject_scheme": "Other"}, {"subitem_subject": "quartz", "subitem_subject_scheme": "Other"}, {"subitem_subject": "feldspar", "subitem_subject_scheme": "Other"}, {"subitem_subject": "silica program", "subitem_subject_scheme": "Other"}, {"subitem_subject": "X-ray diffractometric analysis", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "jpn"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "X線回折によるオーリチィックの定量分析", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "X線回折によるオーリチィックの定量分析"}]}, "item_type_id": "9", "owner": "1", "path": ["1597"], "permalink_uri": "http://hdl.handle.net/10112/5803", "pubdate": {"attribute_name": "公開日", "attribute_value": "2011-12-22"}, "publish_date": "2011-12-22", "publish_status": "0", "recid": "11568", "relation": {}, "relation_version_is_last": true, "title": ["X線回折によるオーリチィックの定量分析"], "weko_shared_id": -1}
X線回折によるオーリチィックの定量分析
http://hdl.handle.net/10112/5803
http://hdl.handle.net/10112/58031f72f0dd-1d84-4f38-9cf5-53254639fdca
名前 / ファイル | ライセンス | アクション |
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KU-1100-19991019-04.pdf (714.2 kB)
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Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2011-12-22 | |||||
タイトル | ||||||
タイトル | X線回折によるオーリチィックの定量分析 | |||||
言語 | ||||||
言語 | jpn | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
その他のタイトル | ||||||
その他のタイトル | Quantitative Analysis of Oolitics by X-Ray Diffractometer | |||||
著者 |
黒川, 豊
× 黒川, 豊× 矢尾井, 潤× 太田, 英明× 三宅, 秀和 |
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著者別名 | ||||||
姓名 | Kurokawa, Yutaka | |||||
著者別名 | ||||||
姓名 | Yaoi, Jun | |||||
著者別名 | ||||||
姓名 | Ota, Hideaki | |||||
著者別名 | ||||||
姓名 | Miyake, Hidekazu | |||||
概要 | ||||||
内容記述タイプ | Other | |||||
内容記述 | Composition is the most important element in controlling green sand. Oolitics, one of the composition, is quantified by analyzing quartz by the silica program test. However this test takes more than 8 hours and the analyzer needs to spend one hour on this work. To shorten this time, we examined another method to quantify oolitics by using X-ray diffractometric analysis for quartz. We chose the calibration curve method as a quantitative. First, we changed the quartz content by using quartz and feldspar, then measured the diffraction X-ray intensity, and obtained calibration curve between quartz content and diffraction X-ray intensity. As a result of comparing each diffraction X-ray intensity of the first peak (angle of diffraction is 2 θ 26.6°) and the second peak (2 θ 20.9°) with quartz quantity analyzed from the silica program, the quantitative precision from the second peak was found to be better, because there was no other material peaked around 2 θ 20.9° for green sand. Although it takes almost 6 hours to analyze quartz by X-ray diffractometric analysis, the actual working time for the analyzer was shortened less than 30 minutes, and the efficiency improved more than two times compared with the silica program test. | |||||
書誌情報 |
鋳造工学 巻 71, 号 3, p. 177-182, 発行日 1999 |
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ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 13420429 | |||||
書誌レコードID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AN10514770 | |||||
権利 | ||||||
権利情報 | 日本鋳造工学会(http://www.jfs.or.jp/) | |||||
著者版フラグ | ||||||
出版タイプ | VoR | |||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||
出版者 | ||||||
出版者 | 日本鋳造工学会 | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | oolitics | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | quartz | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | feldspar | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | silica program | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | X-ray diffractometric analysis |