{"created":"2023-05-15T12:20:51.530301+00:00","id":11568,"links":{},"metadata":{"_buckets":{"deposit":"4f969a7b-1621-41fb-b483-b6467662255b"},"_deposit":{"created_by":1,"id":"11568","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"11568"},"status":"published"},"_oai":{"id":"oai:kansai-u.repo.nii.ac.jp:00011568","sets":["528:1588:1595:1597"]},"author_link":["27283","27277","27281","27282","27284","27280","27279","27278"],"item_9_alternative_title_20":{"attribute_name":"その他のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"Quantitative Analysis of Oolitics by X-Ray Diffractometer"}]},"item_9_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1999","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"3","bibliographicPageEnd":"182","bibliographicPageStart":"177","bibliographicVolumeNumber":"71","bibliographic_titles":[{"bibliographic_title":"鋳造工学"}]}]},"item_9_description_4":{"attribute_name":"概要","attribute_value_mlt":[{"subitem_description":"Composition is the most important element in controlling green sand. Oolitics, one of the composition, is quantified by analyzing quartz by the silica program test. However this test takes more than 8 hours and the analyzer needs to spend one hour on this work. To shorten this time, we examined another method to quantify oolitics by using X-ray diffractometric analysis for quartz. We chose the calibration curve method as a quantitative. First, we changed the quartz content by using quartz and feldspar, then measured the diffraction X-ray intensity, and obtained calibration curve between quartz content and diffraction X-ray intensity. As a result of comparing each diffraction X-ray intensity of the first peak (angle of diffraction is 2 θ 26.6°) and the second peak (2 θ 20.9°) with quartz quantity analyzed from the silica program, the quantitative precision from the second peak was found to be better, because there was no other material peaked around 2 θ 20.9° for green sand. Although it takes almost 6 hours to analyze quartz by X-ray diffractometric analysis, the actual working time for the analyzer was shortened less than 30 minutes, and the efficiency improved more than two times compared with the silica program test.","subitem_description_type":"Other"}]},"item_9_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"27281","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Kurokawa, Yutaka"}]},{"nameIdentifiers":[{"nameIdentifier":"27282","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Yaoi, Jun"}]},{"nameIdentifiers":[{"nameIdentifier":"27283","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Ota, Hideaki"}]},{"nameIdentifiers":[{"nameIdentifier":"27284","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Miyake, Hidekazu"}]}]},"item_9_publisher_34":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"日本鋳造工学会"}]},"item_9_rights_13":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"日本鋳造工学会（http://www.jfs.or.jp/）"}]},"item_9_source_id_10":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN10514770","subitem_source_identifier_type":"NCID"}]},"item_9_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"13420429","subitem_source_identifier_type":"ISSN"}]},"item_9_version_type_17":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"黒川, 豊"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"矢尾井, 潤"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"太田, 英明"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"三宅, 秀和"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2019-05-23"}],"displaytype":"detail","filename":"KU-1100-19991019-04.pdf","filesize":[{"value":"714.2 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"KU-1100-19991019-04.pdf","url":"https://kansai-u.repo.nii.ac.jp/record/11568/files/KU-1100-19991019-04.pdf"},"version_id":"427cf56d-9b2e-4b95-923d-d45e9f2f262f"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"oolitics","subitem_subject_scheme":"Other"},{"subitem_subject":"quartz","subitem_subject_scheme":"Other"},{"subitem_subject":"feldspar","subitem_subject_scheme":"Other"},{"subitem_subject":"silica program","subitem_subject_scheme":"Other"},{"subitem_subject":"X-ray diffractometric analysis","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"X線回折によるオーリチィックの定量分析","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"X線回折によるオーリチィックの定量分析"}]},"item_type_id":"9","owner":"1","path":["1597"],"pubdate":{"attribute_name":"公開日","attribute_value":"2011-12-22"},"publish_date":"2011-12-22","publish_status":"0","recid":"11568","relation_version_is_last":true,"title":["X線回折によるオーリチィックの定量分析"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T19:15:03.663962+00:00"}