{"created":"2023-05-15T12:20:49.838782+00:00","id":11535,"links":{},"metadata":{"_buckets":{"deposit":"495984ec-7c71-4670-8fa3-77fd31c95ed6"},"_deposit":{"created_by":1,"id":"11535","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"11535"},"status":"published"},"_oai":{"id":"oai:kansai-u.repo.nii.ac.jp:00011535","sets":["528:1588:1595:1597"]},"author_link":["27049","27034","27043","27040","27037","27041","27036","27042","27035","27039","27048","27045","27047","27046","27044","27038"],"item_9_alternative_title_20":{"attribute_name":"その他のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"Mass Spectrometric Analysis of Synthetic Polymers Using Desorption/Ionization on Porous Silicon (DIOS) : Optimal Etching Conditions for DIOS Chips"}]},"item_9_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2004","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"3","bibliographicPageEnd":"148","bibliographicPageStart":"142","bibliographicVolumeNumber":"52","bibliographic_titles":[{"bibliographic_title":"Journal of the Mass Spectrometry Society of Japan"}]}]},"item_9_description_4":{"attribute_name":"概要","attribute_value_mlt":[{"subitem_description":"Desorption/ionization on porous silicon (DIOS) is a novel matrix-free variant of laser desorption/ionization (LDI) techniques for mass spectrometry. The DIOS chips are produced by electrochemical etching of silicon wafers under light exposure. In the present report, the optimal conditions, regarding resistivity of silicon wafer, etching current density and etching time, for making DIOS chip with better ionization performance are described. In addition, the DIOS mass spectra of various synthetic polymers including polyethyleneglycol, nonylphenolpolyethoxylate, nonylphenolpolyethoxylatesulfate, polymethylmethacrylate are compared with the matrix-assisted LDI mass spectra.","subitem_description_type":"Other"}]},"item_9_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"27042","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Okuno, Shoji"}]},{"nameIdentifiers":[{"nameIdentifier":"27043","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Shimomae, Yukiyasu"}]},{"nameIdentifiers":[{"nameIdentifier":"27044","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Ohara, Kazuma"}]},{"nameIdentifiers":[{"nameIdentifier":"27045","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Fujiwara, Hiroki"}]},{"nameIdentifiers":[{"nameIdentifier":"27046","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Ohyama, Jun"}]},{"nameIdentifiers":[{"nameIdentifier":"27047","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Ohmoto, Masayoshi"}]},{"nameIdentifiers":[{"nameIdentifier":"27048","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Wada, Yoshinao"}]},{"nameIdentifiers":[{"nameIdentifier":"27049","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Arakawa, Ryuichi"}]}]},"item_9_publisher_34":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Mass Spectrometry Society of Japan"}]},"item_9_source_id_10":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA1254271X","subitem_source_identifier_type":"NCID"}]},"item_9_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"13408097","subitem_source_identifier_type":"ISSN"}]},"item_9_text_35":{"attribute_name":"出版者（他言語）","attribute_value_mlt":[{"subitem_text_value":"日本質量分析学会"}]},"item_9_version_type_17":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"奥野, 昌二"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"下前, 幸康"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"小原, 一真"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"藤原, 博樹"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"大山, 淳"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"大本, 将義"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"和田, 芳直"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"荒川, 隆一"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2019-05-23"}],"displaytype":"detail","filename":"KU-1100-20040000-06.pdf","filesize":[{"value":"191.3 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"KU-1100-20040000-06.pdf","url":"https://kansai-u.repo.nii.ac.jp/record/11535/files/KU-1100-20040000-06.pdf"},"version_id":"25f6cad6-556d-43b6-ae6f-4c09a359dbab"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"DIOS (desorption/ionization on porous silicon)","subitem_subject_scheme":"Other"},{"subitem_subject":"Laser desorption mass spectrometry","subitem_subject_scheme":"Other"},{"subitem_subject":"Synthetic polymer","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"DIOS法を利用した合成高分子の質量分析 : DIOSチップ作製の最適化","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"DIOS法を利用した合成高分子の質量分析 : DIOSチップ作製の最適化"}]},"item_type_id":"9","owner":"1","path":["1597"],"pubdate":{"attribute_name":"公開日","attribute_value":"2012-02-02"},"publish_date":"2012-02-02","publish_status":"0","recid":"11535","relation_version_is_last":true,"title":["DIOS法を利用した合成高分子の質量分析 : DIOSチップ作製の最適化"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T19:15:19.163091+00:00"}